Meet Bettersize at WCPT10 Osaka | Advances in Laser Diffraction & Powder Characterization

Bettersize is pleased to announce our participation in WCPT10 – The 10th World Congress of Particle Technology in Osaka, Japan.

As one of the most influential global events in powder and particle technology, WCPT10 brings together leading researchers, engineers, and industry professionals. Visit us to explore intelligent, application-ready particle characterization solutions for R&D, quality control, and process laboratories.

What to Expect at Our Booth - Booth 12

At our booth, you will have the opportunity to explore our cutting-edge products:

BeNano 180 Zeta Max Nanoparticle Size and Zeta Potential Analyzer   Size range: 0.3 nm - 15 μm Minimum sample volume: 3 μL DLS backscattering (173°) detection technique PALS (Phase Analysis Light Scattering) technique Programmable temperature control range from -15 ℃ to 120 ℃ Refractive index measurement Concentration measurement Sedimentation-based size measurement
	Bettersizer 2600 Laser Diffraction Particle Size Analyzer Wide particle size range: 0.02 to 2,600 μm (wet dispersion); 0.1 to 2,600 μm (dry dispersion) Advanced laser diffraction system: combination of Fourier and inverse Fourier design 92 distributed spherical detectors array: detection of light signals from 0.016° to 165° Auto-alignment of the laser diffraction system: elimination of manual adjustments Compliance with ISO 13320, 21 CFR Part 11, USP <429>, ISO 13322-2
PowderPro A1 Automatic Powder Characteristics Tester   Operation Mode: Automatic Tapping Speed: 50 - 300 taps/min Repeatability: ≤3% variation Compact design Sieve analysis Automated control technology

 Join Our On-site Technical Presentation

Advances in Laser Diffraction for Comprehensive Particle Characterization

Pengfei Liu – Senior Application Engineer, Bettersize Instruments Ltd.
Across Laboratory, Industrial, and Environmental Applications

Date: May 13, 2026
Time: 10:30 – 10:45 AM
Room: 804

This presentation highlights the latest advances in laser diffraction technology, including how modern optical design and intelligent software enable reliable particle size analysis across a wide range of materials and application environments.

Join Pengfei Liu to explore how these innovations can address your specific particle analysis challenges during the Q&A session.

Can't attend in person?

Don't worry. We'll make sure you don't miss out.

Contact us to request the presentation slides or schedule a one-on-one virtual discussion with our application team.

Book a meeting or stop by our booth for a live demo.