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Unlock Nanoscale Insights at IMRC 2026 | Discover Bettersize's Most Advanced Research Platform

2026-08-05Exhibitions

August 16–20, 2026 | Cancún, Quintana Roo, Mexico | Booth 38

 

 

Bettersize is excited to participate in the 34th International Materials Research Congress (IMRC 2026), one of the world's premier multidisciplinary materials research forums, drawing nearly 2,000 scientists from over 50 countries. We invite you to Booth 38 for a deep dive into cutting-edge particle characterization technology designed for frontier research.
 
This year, we're putting the spotlight on the BeNano 180 Zeta Max — our flagship nanoparticle analyzer that pushes the boundaries of what a single DLS system can do. Whether you're studying nanocomposites, colloidal self-assembly, nanoparticle synthesis, or soft matter physics, come see how multi-angle detection and extended-range measurement can give you data you didn't know you were missing.

 

 

 

 

Featured Solutions at IMRC 2026

Booth 38

 

 

Featured: BeNano 180 Zeta Max

Next-Generation Nanoparticle Analyzer with Multi-Angle Light Scattering

Not just another DLS system. The BeNano 180 Zeta Max combines four detection angles and sedimentation mode to deliver more data from one sample:

 

  • 173° / 90° / 12° / 0° multi-angle detection — cross-validate results, measure zeta potential, and determine dispersant refractive index — all in one run
  • Sedimentation mode — extends sizing up to ~50 μm using Stokes' law, bridging nano and micron scales
  • DLS + SLS + ELS + transmission — particle size, zeta potential, molecular weight, concentration, and microrheology on one platform
  • Ultra-low 3 μL sample volume — preserves precious research materials

 

 

One instrument. One sample. Complete nanoscale characterization.

 

 

 

 

 

Curious About Research-Grade Laser Diffraction? Ask Us About the Bettersizer S3 Plus

 

For researchers who need the ultimate in resolution and sensitivity, we'd love to tell you about the Bettersizer S3 Plus — our top-tier research instrument with the patented DLOI (Dual Lenses & Oblique Incidence) system that measures down to 0.01 μm with unmatched resolution.

 

 

 


Highlights:

 

  • Ultra-fine particle detection down to 0.01 μm via DLOI technology
  • Simultaneous size and shape analysis (0.01 – 3,500 μm)
  • Dual-camera imaging for real-time particle visualization and oversized particle detection
  • Refractive index measurement for unknown samples
  • Built for top-tier scientific research

 

 

 

Why Visit Bettersize Booth 38?

 

1-on-1 technical discussions with our application scientists — bring your toughest characterization questions
✔  Exclusive insights: Get a deep dive into how our solutions can accelerate your research workflow
Hands-on experience: Explore the instruments up close and see the software in action

 

We look forward to connecting with materials scientists, researchers, and industry professionals at IMRC 2026. Whether you're developing new nanocomposites, optimizing ceramic processing, characterizing metal powders, or exploring advanced materials, Bettersize has the analytical tools to support your work.

 

 

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    Stop by Booth 38 — let's talk particles.

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    Can't attend in person?
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    Don't worry. We'll make sure you don't miss out. Contact us to schedule a one-on-one virtual discussion with our application team.

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