Oversize particle analysis combining laser diffraction and dynamic image analysis with the Bettersizer S3 Plus
Laser diffraction is a powerful method for rapidly measuring particle size across a wide size range. However, it faces challenges in accurately determining the size of low volume fractions of oversized particles. To overcome this limitation, the combination of laser diffraction with dynamic image analysis proves to be a valuable solution.
The integration of these techniques in the Bettersizer S3 Plus enables efficient and reliable particle size analysis, as exemplified by the case study involving two quartz sands of varying coarseness. This combined approach offers a comprehensive and precise characterization of particle size distribution, ensuring accurate results for a wide range of applications.
Measurement by Technology:
Instrument used for oversize particle analysis：
0.01 - 3,500μm (Laser System)
2 - 3,500μm (Image System)
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