Surface Cleanliness Detection of Silicon Substrates by the BeVision M1 Static Image Analyzer
The cleanliness of the substrate surface is crucial to the quality and performance of the material that grows on it. The BeVision M1 static image analyzer provides powerful support for the detection of surface cleanliness of silicon substrate materials, greatly saving detection time and labor costs....
Measuring the Thermal Sensitive Rheological Behavior of BSA Solution with the BeNano 180 Zeta
This application presents the use of Dynamic Light Scattering Microrheology (DLS Microrheology) to measure the thermal-sensitive rheological behavior of a BSA (bovine serum albumin) solution using the BeNano 180 Zeta. DLS Microrheology utilizes tracer particles to measure the mean square displacemen...
Particle Size and Tapped Density Analysis of Anode Materials of Lithium-ion Batteries
The particle size and tapped density of anode materials play a pivotal role in the performance of Lithium-ion batteries. This study employs the Bettersizer 2600 laser diffraction particle size analyzer and BeDensi T3 Pro tapped density tester to investigate the effects of varying blending ratios of ...
