BeVision D2

2. Recognize Connected Paticles
The main purpose of the function is to filter agglomerate or adhesive particles, in order to avoid that test result is affected. Connected particles refer to agglomerate particles forming by two or more than two adhesive particles. The feature of connected particles is that there is sunken area in particle image. Through judging the size, depth and angle of the sunken area, connected particles can be recognized.



3. Automatic Circulation and Dispersion System
The dry system adopts electromagnetic vibration feeding, gravity-driven dispersion, which ensures sampling is uniform and continuous. The wet system uses an external circulating dispersion system with ultrasonic dispersion and centrifugal circulation. It is easy to convert between wet and dry mode.

4. Application of BeVision D2
Dry method: Applies to analyze granular samples between 30 um to 10 mm, such as salt, sugar, plastic products, catalyst, abrasive, carbon products, sand, coal, coffee, refractory, food, polystyrene, glass, ceramics, fertilizer, medicine, ore, etc.

Wet method: Silicon carbide, corundum, diamond, garnet, spherical graphite powder, spherical aluminum powder, lead-tin alloy powder and other atomized metal powder, glass beads, polystyrene, wollastonite, scientific research, teaching, etc.

5. Imaging Theory of Free Falling Particles
Adopts high-speed CCD camera-120 images per second, microsecond exposure time, avoid trailing phenomenon in moving particle. More than 10 thousand particles could be analyzed per minute by the special image processing software. During the process of free falling of particles, shoot particle images which pass the lens randomly. Meanwhile, software quickly recognizes and processes particles, and screen displays images, particle size and particle shape data for each particle in real time. As it adopts high-speed CCD that can reach 100frame/min, thousands of particles can be shot and processed per minute, and image process software can recognize and extract adhesive particles automatically. These technologies improve analysis speed, precision and accuracy of particle image greatly.