Home > Industries > Electronics and Semiconductors
Electronics and Semiconductors banner

Electronics and Semiconductors

Bettersize instruments provide the particle size distribution testing and particle shape testing of the raw materials of electronic products.

 

In the electronics industry, many materials and processes have strict requirements for particle size and particle shape. For example, the silicon carbide powder used for cutting silicon wafers requires a tight particle size distribution and a sharp particle shape corner angle, the cerium oxide abrasive used for polishing requires a small particle size without large particles, and the silica dioxide materials used for sealing integrated circuits require strict standards for the particle size distribution and spherical degree. Particle size and particle shape analysis is a basic method of production and product quality guarantee in the electronics industry.

During the research, design, manufacturing and quality control of electronic components, the Bettersize particle size and particle shape analysis system can help you to realize material properties, including:

Guaranteeing CMP slurry quality.
Guaranteeing particle size and particle shape of milling for cutting and polishing.
Guaranteeing the quality of integrated circuit sealing materials.

Read more

Curated Resources

    More resources

    Related Particle Size Analyzer

    • BeNano 180 Zeta Pro

      BeNano 180 Zeta Pro

      Nanoparticle Size and Zeta Potential Analyzer

      Technology: Dynamic Light Scattering, Electrophoretic Light Scattering, Static Light Scattering

    • Bettersizer 2600

      Bettersizer 2600

      Laser Diffraction Particle Size Analyzer

      Measurement range: 0.02 - 2,600μm (Wet)

      Measurement range: 0.1 - 2,600μm (Dry)

    • BeVision M1

      BeVision M1

      Automated Static Image Analyzer

      Dispersion type: Dry

      Measurement range: 1 - 10,000μm

      Technology: Automated Static Image Analysis

    • Bevision-S1 Classical and Versatile Static Image Analyzer

      BeVision S1

      Classical and Versatile Static Image Analyzer

      Dispersion type: Dry & Wet

      Measurement range: 1 - 3,000μm

      Technology: Static Image Analysis

    • BeDensi B1 Bulk Density Tester

      BeDensi B1

      Bulk Density Tester

      Measurement: Bulk Density

      Compliance with GB/T 16913

    • HFlow 1 Flowmeter Funnel

      HFlow 1

      Flowmeter Funnel

      Measurement: Bulk density and Flow rate

      Compliance with USP, Ph. Eur., ASTM, and ISO standards